- 描探微
- 掃描探針顯微鏡
- 掃描探針顯微術(shù)
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scanning probe microscopy中文什么意思
例句與用法
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- The applications of scanning probe microscopy a review
掃描探針顯微術(shù)的應(yīng)用綜述 - Scanning probe microscopy based nanotechnology
基于掃描探針顯微鏡的納米技術(shù) - Scanning probe microscopy of combined snom sfm cantilever probe
結(jié)合的掃描探測顯微鏡 - Scanning probe microscopy ( spm ) related surface science and nanotechnology
與掃描探針有關(guān)的表面科學(xué)和納米技術(shù) - Scanning probe microscopy fg 8ou
掃描探針顯微鏡
百科釋義
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
詳細(xì)百科解釋